home: http://www.to.infn.it/wiki/doku.php?id=cms:nicolo
year Activity
1
- Study and comparison of TDC architectures via simulations i.e. analogue approach based on Time to Amplitude Converter (TAC) vs digital approach based on Phase Locked Loops (PLL) or
- Delay Locked Loops (DLL)
- Selection of the technology best suited for the design
- Exploring the use of strained lattice hetero-junction bi-polar devices (SiGe)
2
- q1-q2 Design of critical building blocks of the architecture(s) under analysis in the selected technology. Submission of the blocks.
- q3 Test board design and test set-up preparation
- q4 Test of the building blocks
3
- q1 Completion of the tests and selection of the architecture
- q1-q2 Design of the first prototype for the selected architecture
- q3 Test board design and test set-up preparation
- q4 Electrical tests of the prototype
4
- q1-2 Tests of the prototype coped with the detector
- q3-4 Design of the chip demonstrator
5
- q1 Design of the chip demonstrator
- q2 Test board design and test set-up preparation
- q3-q4 Test of the chip demonstrator