home: http://www.to.infn.it/wiki/doku.php?id=cms:nicolo year Activity 1 - Study and comparison of TDC architectures via simulations i.e. analogue approach based on Time to Amplitude Converter (TAC) vs digital approach based on Phase Locked Loops (PLL) or - Delay Locked Loops (DLL) - Selection of the technology best suited for the design - Exploring the use of strained lattice hetero-junction bi-polar devices (SiGe) 2 - q1-q2 Design of critical building blocks of the architecture(s) under analysis in the selected technology. Submission of the blocks. \\ - q3 Test board design and test set-up preparation \\ - q4 Test of the building blocks 3 - q1 Completion of the tests and selection of the architecture \\ - q1-q2 Design of the first prototype for the selected architecture \\ - q3 Test board design and test set-up preparation \\ - q4 Electrical tests of the prototype 4 - q1-2 Tests of the prototype coped with the detector \\ - q3-4 Design of the chip demonstrator \\ 5 - q1 Design of the chip demonstrator \\ - q2 Test board design and test set-up preparation \\ - q3-q4 Test of the chip demonstrator